Status of multi-beam long trace-profiler development | Zendy

Mikhail V. Gubarev | Zendy; Daniel J. Merthe | Zendy; Kiranmayee Kilaru | Zendy; Thomas Kester | Zendy; Brian D. Ramsey | Zendy; Wayne R. McKinney | Zendy; Peter Z. Takacs | Zendy; Andrew Dahir | Zendy; Valeriy V. Yashchuk | Zendy

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Status of multi-beam long trace-profiler development

Author(s) -

Mikhail V. Gubarev,

Daniel J. Merthe,

Kiranmayee Kilaru,

Thomas Kester,

Brian D. Ramsey,

Wayne R. McKinney,

Peter Z. Takacs,

Andrew Dahir,

Valeriy V. Yashchuk

Publication year - 2013

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.2027146

Subject(s) - trace (psycholinguistics) , computer science , remote sensing , geology , philosophy , linguistics

The multi-beam long trace profiler (MB-LTP) is under development at NASA’s Marshall Space Flight Center. The traditional LTPs scans the surface under the test by a single laser beam directly measuring the surface figure slope errors. While capable of exceptional surface slope accuracy, the LTP single beam scanning has slow measuring speed. Metrology efficiency can be increased by replacing the single laser beam with multiple beams that can scan a section of the test surface at a single instance. The increase in speed with such a system would be almost proportional to the number of laser beams. The progress for a multi-beam long trace profiler development is presented.

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