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Improve dithering technique for 3D shape measurement: phase vs intensity optimization
Author(s) -
Junfei Dai,
Beiwen Li,
Song Zhang
Publication year - 2013
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2022226
Subject(s) - dither , structured light 3d scanner , computer science , phase (matter) , intensity (physics) , binary number , projection (relational algebra) , quality (philosophy) , computer vision , optics , artificial intelligence , algorithm , mathematics , physics , noise shaping , arithmetic , scanner , quantum mechanics
This paper presents a thorough comparison between a phase-based and an intensity-based optimization method for 3D shape measurement with the binary dithering techniques. Since for a 3D shape measurement system utilizing digital fringe projection techniques, the phase quality ultimately determines the measurement quality, and thus these two methods are compared in phase domain. Both simulation and experiments find that the phase-based optimization method can generate high-quality phase under given conditions. However, this method is sensitive to the amount of blurring (or defocusing). On contrast, the intensity-based optimization method can consistently generate high-quality phase with various amounts of defocusing. Both experiments and simulations will be presented to compare these two optimization methods. © 2013 SPIE.

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