Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer | Zendy

Todd A. Decker | Zendy; R C Montesanti | Zendy; J. Bixler | Zendy; Charles J. Hailey | Zendy; S. M. Kahn | Zendy

Open Access

<title>Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer</title>

Author(s) -

Todd A. Decker,

R C Montesanti,

J. Bixler,

Charles J. Hailey,

S. M. Kahn

Publication year - 1994

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.193208

Subject(s) - optics , spectrometer , grating , diffraction grating , breadboard , silicon carbide , interferometry , reflection (computer programming) , materials science , diffraction efficiency , metrology , blazed grating , diffraction , fabrication , holographic grating , optoelectronics , physics , computer science , engineering , medicine , electrical engineering , alternative medicine , pathology , metallurgy , programming language

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