<title>Digital speckle pattern interferometry (DSPI): a fast procedure to detect and measure vibration mode shapes</title>
Author(s) -
Pierre Slangen,
L. Berwart,
Christophe De Veuster,
JeanClaude Golinval,
Yves Lion
Publication year - 1994
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.185317
Subject(s) - speckle pattern , electronic speckle pattern interferometry , interferometry , displacement (psychology) , vibration , optics , materials science , cantilever , measure (data warehouse) , modal analysis , physics , computer science , acoustics , composite material , psychology , database , psychotherapist
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