Open AccessMicroanalytical study of defect formation in thin bismuth strontium calcium copper oxide films
Author(s) -
R. H. Howell,
A. Chaiken,
R. G. Musket,
M. A. Wall,
M. Balooch,
D. Phinney,
M. J. Fluss,
J. N. Eckstein,
I. Božović,
G. F. Virshup
Publication year - 1994
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.182681
Subject(s) - materials science , analytical chemistry (journal) , bismuth , spectroscopy , thin film , strontium , copper , transmission electron microscopy , strontium titanate , chemistry , nanotechnology , metallurgy , physics , organic chemistry , chromatography , quantum mechanics
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