Open AccessX-ray reflectivity of the AXAF VETA-I optics
Author(s) -
E. Kellogg,
George Chartas,
Dale E. Graessle,
John P. Hughes,
Leon P. Van Speybroeck,
Ping Zhao,
Martin C. Weisskopf,
Ronald F. Elsner,
Stephen L. O’Dell
Publication year - 1993
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.140552
Subject(s) - reflectivity , polishing , range (aeronautics) , materials science , cutoff , optics , synchrotron , x ray reflectivity , physics , quantum mechanics , composite material
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