Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting | Zendy

George H. Major | Zendy; Vincent Fernandez | Zendy; Neal Fairley | Zendy; Emily F. Smith | Zendy; Matthew R. Linford | Zendy

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Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting

Author(s) -

George H. Major,

Vincent Fernandez,

Neal Fairley,

Emily F. Smith,

Matthew R. Linford

Publication year - 2022

Publication title -

journal of vacuum science and technology a vacuum surfaces and films

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.583

H-Index - 112

eISSN - 1520-8559

pISSN - 0734-2101

DOI - 10.1116/6.0001975

Subject(s) - x ray photoelectron spectroscopy , residual , maxima , analytical chemistry (journal) , function (biology) , curve fitting , standard deviation , sample (material) , minification , computational physics , chemistry , materials science , algorithm , mathematics , statistics , physics , thermodynamics , nuclear magnetic resonance , mathematical optimization , performance art , art history , evolutionary biology , biology , art , chromatography

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