Low-macroscopic field emission structure: Using the shape of the conductor to identify a local difference in electric potential
Author(s) -
Laurent Lapena,
Alain Degiovanni,
Victoria Tishkova,
Evelyne Salançon
Publication year - 2022
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/6.0001716
Subject(s) - electric field , conductor , electrical conductor , materials science , field electron emission , crystal (programming language) , micrometer , electron , local field , field (mathematics) , condensed matter physics , electric potential , volt , optics , voltage , physics , composite material , quantum mechanics , computer science , mathematics , pure mathematics , programming language
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