XPS guide: Charge neutralization and binding energy referencing for insulating samples | Zendy

Donald R. Baer | Zendy; Kateryna Artyushkova | Zendy; Hagai Cohen | Zendy; Christopher D. Easton | Zendy; Mark Engelhard | Zendy; Thomas R. Gengenbach | Zendy; Grzegorz Greczyński | Zendy; Paul Mack | Zendy; David Morgan | Zendy; Adam Roberts | Zendy

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XPS guide: Charge neutralization and binding energy referencing for insulating samples

Author(s) -

Donald R. Baer,

Kateryna Artyushkova,

Hagai Cohen,

Christopher D. Easton,

Mark Engelhard,

Thomas R. Gengenbach,

Grzegorz Greczyński,

Paul Mack,

David Morgan,

Adam Roberts

Publication year - 2020

Publication title -

journal of vacuum science and technology a vacuum surfaces and films

Language(s) - English

Resource type - Journals

eISSN - 1520-8559

pISSN - 0734-2101

DOI - 10.1116/6.0000057

Subject(s) - x ray photoelectron spectroscopy , binding energy , charge (physics) , materials science , energy (signal processing) , computer science , analytical chemistry (journal) , nanotechnology , chemistry , atomic physics , chemical engineering , engineering , physics , environmental chemistry , quantum mechanics

This guide deals with methods to control surface charging during XPS analysis of insulating samples and approaches to extracting useful binding energy information. The guide summarizes the causes o...

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