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Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy
Author(s) -
Alexei Gruverman,
Oleg Kolosov,
Jun Hatano,
Koichiro Takahashi,
Hiroshi Tokumoto
Publication year - 1995
Publication title -
journal of vacuum science and technology b microelectronics and nanometer structures processing measurement and phenomena
Language(s) - English
Resource type - Journals
eISSN - 1520-8567
pISSN - 1071-1023
DOI - 10.1116/1.587909
Subject(s) - piezoresponse force microscopy , nucleation , ferroelectricity , piezoelectricity , polarization (electrochemistry) , materials science , nanoscopic scale , atomic force microscopy , electric field , condensed matter physics , microscopy , optics , nanotechnology , chemistry , optoelectronics , physics , composite material , organic chemistry , quantum mechanics , dielectric
The ferroelectric domain structure and its dynamics under applied electric field have been studied with nanoscale resolution by atomic force microscopy (AFM). Two mechanisms responsible for the contrast between opposite domains are proposed: large built‐in domains are delineated in friction mode due to the tip–sample electrostatic interaction, and small domains created by an external field are imaged in topography mode due to piezoelectric deformation of the crystal. The ability of effective control of ferroelectric domains by applying a voltage between the AFM tip and the bottom electrode is demonstrated. It is experimentally confirmed that the sidewise growth of domain proceeds through the nucleation process on the domain wall

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