Atomic force microscopy and manipulation of living glial cells
Author(s) -
Vladimir Parpura,
P. G. Haydon,
Donald S. Sakaguchi,
Eric Henderson
Publication year - 1993
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.578346
Subject(s) - atomic force microscopy , adhesion , substrate (aquarium) , microscopy , living cell , nanotechnology , materials science , high resolution , biophysics , chemistry , optics , microbiology and biotechnology , biology , physics , composite material , ecology , remote sensing , geology
The atomic force microscope (AFM) is capable of imaging surfaces at very high resolution. The AFM has been used to image living glial cells in culture. Typical images reveal the three‐dimensional shape of the cell and often internal cellular structures are visible. In this report, it is shown that by increasing the imaging force, cells can be removed from the surface on which they are grown. Although the forces involved in this process are complex, it is possible to compare relative adhesion of different types of living cells to a particular substrate.
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