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Defect and impurity effects on the initial growth of Ag on Si(111)
Author(s) -
J.K. Zuo,
J. F. Wendelken
Publication year - 1991
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.577658
Subject(s) - impurity , superlattice , coalescence (physics) , condensed matter physics , materials science , anisotropy , electron diffraction , monolayer , low energy electron microscopy , epitaxy , scaling , growth rate , crystallography , diffraction , chemistry , optics , electron microscope , nanotechnology , physics , layer (electronics) , geometry , organic chemistry , mathematics , astrobiology

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