Open AccessTransmission Mueller-matrix characterization of transparent ramie films
Author(s) -
A. MendozaGalván,
Yuanyuan Li,
Xuan Yang,
Roger Magnusson,
Kenneth Järrendahl,
Lars A. Berglund,
Hans Arwin
Publication year - 2019
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5129651
Subject(s) - mueller calculus , ramie , materials science , birefringence , refractive index , optics , ellipsometry , polarization (electrochemistry) , dispersion (optics) , polarizer , optoelectronics , composite material , polarimetry , nanotechnology , scattering , thin film , fiber , chemistry , physics
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