Open AccessEllipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor
Author(s) -
E. Rodríguez-Schwendtner,
A. ÁlvarezHerrero,
A. Mariscal,
R. Serna,
Agustı́n González-Cano,
María-Cruz Navarrete,
Natalia Díaz-Herrera
Publication year - 2019
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5121590
Subject(s) - materials science , optical fiber , characterization (materials science) , plasmon , bismuth , ellipsometry , optoelectronics , fiber , optics , fiber optic sensor , deposition (geology) , thin film , nanotechnology , composite material , paleontology , physics , sediment , metallurgy , biology
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