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Optical constants of polycrystalline Ni from 0.06 to 6.0 eV at 300 K
Author(s) -
Farzin Abadizaman,
Stefan Zollner
Publication year - 2019
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5118841
Subject(s) - drude model , materials science , refractive index , crystallite , ellipsometry , dielectric , optical conductivity , dielectric function , condensed matter physics , scattering , conductivity , scattering rate , analytical chemistry (journal) , optics , thin film , optoelectronics , physics , nanotechnology , chemistry , chromatography , metallurgy

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