Resistivity and surface scattering of (0001) single crystal ruthenium thin films
Author(s) -
Sameer Ezzat,
Prabhu Doss Mani,
Asim Khaniya,
William E. Kaden,
Daniel Gall,
K. Barmak,
Kevin R. Coffey
Publication year - 2019
Publication title -
journal of vacuum science and technology. a. vacuum, surfaces, and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.5093494
Subject(s) - electrical resistivity and conductivity , materials science , scattering , thin film , single crystal , annealing (glass) , x ray photoelectron spectroscopy , low energy electron diffraction , electron diffraction , analytical chemistry (journal) , condensed matter physics , composite material , nanotechnology , chemistry , optics , crystallography , chemical engineering , diffraction , chromatography , electrical engineering , engineering , physics
The resistivity size effect in nanoscale metals is of both scientific and technological interest, the latter due to its importance to interconnects between transistors in integrated circuits. In th...
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom