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Brilliance improvement of laser-produced extreme ultraviolet and soft x-ray plasmas based on pulsed gas jets
Author(s) -
Jonathan Holburg,
Matthias Müller,
Klaus Mann,
Stephan Wieneke
Publication year - 2019
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.5089201
Subject(s) - extreme ultraviolet lithography , extreme ultraviolet , xenon , krypton , plasma , laser , optics , materials science , radiation , wavelength , atomic physics , optoelectronics , physics , quantum mechanics
Two methods improving the brilliance of laser-induced plasmas emitting in the extreme UV (EUV) and soft x-ray (SXR) regions were investigated, using three different gases (nitrogen, krypton, and xenon) from a pulsed gas jet. Utilizing a newly designed piezoelectric valve, up to almost ten times higher gas pressures were applied, resulting in increased target densities and thus, higher conversion efficiencies of laser energy into EUV and SXR radiation. Secondly, geometrically reducing the angle between the incoming laser beam and the observed plasma emission minimizes reabsorption of the emitted short wavelength radiation. Combining both methods, the source brilliance is increased by a factor of 5 for nitrogen. Furthermore, a compact EUV focusing system for metrological applications is presented utilizing the optimized plasma source. An energy density of 1 mJ/cm2 at wavelength λ = 13.5 nm in the focal spot of an ellipsoidal mirror is achieved with xenon as the target gas being sufficient for material removal of PMMA samples with an ablation rate of 0.05 nm/pulse.Two methods improving the brilliance of laser-induced plasmas emitting in the extreme UV (EUV) and soft x-ray (SXR) regions were investigated, using three different gases (nitrogen, krypton, and xenon) from a pulsed gas jet. Utilizing a newly designed piezoelectric valve, up to almost ten times higher gas pressures were applied, resulting in increased target densities and thus, higher conversion efficiencies of laser energy into EUV and SXR radiation. Secondly, geometrically reducing the angle between the incoming laser beam and the observed plasma emission minimizes reabsorption of the emitted short wavelength radiation. Combining both methods, the source brilliance is increased by a factor of 5 for nitrogen. Furthermore, a compact EUV focusing system for metrological applications is presented utilizing the optimized plasma source. An energy density of 1 mJ/cm2 at wavelength λ = 13.5 nm in the focal spot of an ellipsoidal mirror is achieved with xenon as the target gas being sufficient for material remov...

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