Area selective deposition of TiO2 by intercalation of plasma etching cycles in PEALD process: A bottom up approach for the simplification of 3D integration scheme
Author(s) -
R. Vallat,
R. Gassilloud,
O. Salicio,
Khalil El Hajjam,
G. Molas,
Bernard Pélissier,
C. Vallée
Publication year - 2019
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.5049361
Subject(s) - atomic layer deposition , substrate (aquarium) , materials science , tin , x ray photoelectron spectroscopy , fluorine , passivation , deposition (geology) , etching (microfabrication) , layer (electronics) , oxide , chemical engineering , analytical chemistry (journal) , inorganic chemistry , nanotechnology , chemistry , metallurgy , paleontology , oceanography , chromatography , sediment , engineering , biology , geology
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