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Impact of reduced graphene oxide on MoS2 grown by sulfurization of sputtered MoO3 and Mo precursor films
Author(s) -
Shanèe Pacley,
Jianjun Hu,
Michael L. Jespersen,
Al M. Hilton,
Adam R. Waite,
Jacob Brausch,
E. Beck-Millerton,
Andrey A. Voevodin
Publication year - 2016
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.4952399
Subject(s) - molybdenum disulfide , graphene , materials science , x ray photoelectron spectroscopy , chemical vapor deposition , oxide , monolayer , stoichiometry , molybdenum , chemical engineering , sputtering , thin film , transmission electron microscopy , nanotechnology , metallurgy , chemistry , organic chemistry , engineering
Monolayer molybdenum disulfide (MoS2), a two dimensional semiconducting dichalcogenide material with a bandgap of 1.8–1.9 eV, has demonstrated promise for future use in field effect transistors and optoelectronics. Various approaches have been used for MoS2 processing, the most common being chemical vapor deposition. During chemical vapor deposition, precursors such as Mo, MoO3, and MoCl5 have been used to form a vapor reaction with sulfur, resulting in thin films of MoS2. Currently, MoO3 ribbons and powder, and MoCl5 powder have been used. However, the use of ribbons and powder makes it difficult to grow large area-continuous films. Sputtering of Mo is an approach that has demonstrated continuous MoS2 film growth. In this paper, the authors compare the structural properties of MoS2 grown by sulfurization of pulse vapor deposited MoO3 and Mo precursor films. In addition, they have studied the effects that reduced graphene oxide (rGO) has on MoS2 structure. Reports show that rGO increases MoS2 grain growth...

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