Open AccessComparative study of the native oxide on 316L stainless steel by XPS and ToF-SIMS
Author(s) -
Sabrina Tardio,
MarieLaure Abel,
R. H. Carr,
J. E. Castle,
John F. Watts
Publication year - 2015
Publication title -
journal of vacuum science and technology. a. vacuum, surfaces, and films
Language(s) - English
Resource type - Journals
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.4927319
Subject(s) - x ray photoelectron spectroscopy , hydroxide , dissolution , oxide , secondary ion mass spectrometry , materials science , analytical chemistry (journal) , metal , layer (electronics) , thin film , inorganic chemistry , mass spectrometry , chemistry , chemical engineering , metallurgy , nanotechnology , environmental chemistry , chromatography , engineering
The very thin native oxide film on stainless steel, of the order of 2 nm, is known to be readily modified by immersion in aqueous media. In this paper, XPS and ToF-SIMS are employed to investigate the nature of the air-formed film and modification after water emmersion. The film is described in terms of oxide, hydroxide and water content. The preferential dissolution of iron is shown to occur on immersion. It is shown that a water absorbed layer and a hydroxide layer are present above the oxide-like passive film. The concentrations of water and hydroxide appear to be higher in the case of exposure to water. A secure method for the peak fitting of Fe2p and Cr2p XPS spectra of such films on their metallic substrates is described. The importance of XPS survey spectra is underlined and the feasibility of C60+ SIMS depth profiling of a thin oxide layer is shown
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