In situ study of erosion and deposition of amorphous hydrogenated carbon films by exposure to a hydrogen atom beam
Author(s) -
S. Markelj,
Primož Pelicon,
I. Čadež,
T. SchwarzSelinger,
W. Jacob
Publication year - 2012
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.4723637
Subject(s) - elastic recoil detection , hydrogen , ion beam analysis , deuterium , amorphous carbon , carbon fibers , analytical chemistry (journal) , deposition (geology) , ion beam , materials science , layer (electronics) , atom (system on chip) , hydrogen atom , amorphous solid , atomic physics , ion , chemistry , crystallography , nanotechnology , composite material , composite number , computer science , biology , embedded system , paleontology , alkyl , chromatography , physics , organic chemistry , sediment
This paper reports on the first dual-beam experiment employing a hydrogen atom beam for sample exposure and an ion beam for analysis, enabling in situ and real-time studies of hydrogen atom interaction with materials. The erosion of an amorphous hydrogenated carbon (a-C:H) layer by deuterium atoms at 580 K sample temperature was studied and the uptake of deuterium during the erosion process was measured in real time. The deuterium areal density increased at the beginning to 7.3 × 1015 D cm−2, but then stabilized at a constant value of 5.5 × 1015 D cm−2. Formation of a polymer-like deposit on an a-C:H layer held at room temperature and subjected to the deuterium atom beam was observed and also studied in situ. For both erosion and deposition studies an a-13C:H layer on top of an Si substrate was used as a sample, making the experiments isotopically fully specified and thereby differentiating the deposited from the original layer and the interacting D atoms from H atoms present in the layer and in the resid...
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