Indium nitride epilayer prepared by UHV-plasma-assisted metalorganic molecule beam epitaxy
Author(s) -
WeiChun Chen,
ShouYi Kuo,
FangI Lai,
Woei-Tyng Lin,
ChienNan Hsiao,
Din Ping Tsai
Publication year - 2011
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.3622315
Subject(s) - indium nitride , molecular beam epitaxy , materials science , indium , crystallinity , transmission electron microscopy , scanning electron microscope , epitaxy , substrate (aquarium) , thin film , analytical chemistry (journal) , nitride , full width at half maximum , optoelectronics , nanotechnology , chemistry , composite material , layer (electronics) , oceanography , chromatography , geology
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