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Reflectance anisotropy spectroscopy: A probe to explore organic epitaxial growth
Author(s) -
Gianlorenzo Bussetti,
Simonetta Cirilli,
A. Violante,
V. Chiostri,
C. Goletti,
P. Chiaradia,
A. Sassella,
Marcello Campione,
Luisa Raimondo,
Daniele Braga,
A. Borghesi
Publication year - 2009
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.3155399
Subject(s) - epitaxy , molecular beam epitaxy , anisotropy , substrate (aquarium) , materials science , spectroscopy , characterization (materials science) , monolayer , crystallinity , in situ , microscopy , deposition (geology) , analytical chemistry (journal) , optoelectronics , layer (electronics) , optics , nanotechnology , chemistry , organic chemistry , composite material , geology , physics , paleontology , oceanography , quantum mechanics , sediment
Reflectance anisotropy spectroscopy (RAS) is demonstrated to be particularly suitable for studying the deposition of organic epitaxial layers in ultrahigh vacuum by organic molecular beam epitaxy, thanks to its high sensitivity and applicability in situ. In the case of α -quaterthiophene, both homoepitaxy and heteroepitaxy have been monitored, demonstrating the crystallinity of the films up to tens of monolayers and the epitaxial relation to the substrate. In both cases, optical RAS data are compared to the results of ex situ characterization of the same samples by atomic force microscopy. © 2009 American Vacuum Society

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