Direct observations of rapid diffusion of Cu in Au thin films using in situ x-ray diffraction | Zendy

J. W. Elmer | Zendy; Todd Palmer | Zendy; E. D. Specht | Zendy

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Direct observations of rapid diffusion of Cu in Au thin films using in situ x-ray diffraction

Author(s) -

J. W. Elmer,

Todd Palmer,

E. D. Specht

Publication year - 2006

Publication title -

journal of vacuum science and technology a vacuum surfaces and films

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.583

H-Index - 112

eISSN - 1520-8559

pISSN - 0734-2101

DOI - 10.1116/1.2204926

Subject(s) - grain boundary diffusion coefficient , activation energy , materials science , grain boundary , effective diffusion coefficient , annealing (glass) , thin film , diffraction , analytical chemistry (journal) , lattice diffusion coefficient , isothermal process , diffusion , grain size , crystallography , atomic diffusion , grain growth , microstructure , chemistry , thermodynamics , metallurgy , nanotechnology , optics , physics , chromatography , magnetic resonance imaging , radiology , medicine

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