Deposition of gold nanofeatures on silicon samples by field-induced deposition using a scanning tunneling microscope | Zendy

Husam R. Abed | Zendy; H. Jamgotchian | Zendy; H. Dallaporta | Zendy; B. Gely | Zendy; P. Bindzi | Zendy; D. Chatain | Zendy; S. Nitsche | Zendy; Damien Chaudanson | Zendy; E. Cambril | Zendy; V. I. Safarov | Zendy; D. Tonneau | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Deposition of gold nanofeatures on silicon samples by field-induced deposition using a scanning tunneling microscope

Author(s) -

Husam R. Abed,

H. Jamgotchian,

H. Dallaporta,

B. Gely,

P. Bindzi,

D. Chatain,

S. Nitsche,

Damien Chaudanson,

E. Cambril,

V. I. Safarov,

D. Tonneau

Publication year - 2005

Publication title -

journal of vacuum science and technology b microelectronics and nanometer structures processing measurement and phenomena

Language(s) - English

Resource type - Journals

eISSN - 1520-8567

pISSN - 1071-1023

DOI - 10.1116/1.1943440

Subject(s) - scanning electron microscope , scanning tunneling microscope , materials science , silicon , electron beam induced deposition , deposition (geology) , field electron emission , field emission microscopy , electrochemical scanning tunneling microscope , microscope , scanning probe microscopy , analytical chemistry (journal) , optoelectronics , nanotechnology , optics , scanning tunneling spectroscopy , scanning transmission electron microscopy , chemistry , electron , composite material , diffraction , paleontology , physics , chromatography , quantum mechanics , sediment , biology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research