Towards a better understanding of the operative mechanisms underlying impurity-free disordering of GaAs: Effect of stress
Author(s) -
Sagar P. Doshi,
Prakash N. K. Deenapanray,
Hark Hoe Tan,
C. Jagadish
Publication year - 2003
Publication title -
journal of vacuum science and technology b microelectronics and nanometer structures processing measurement and phenomena
Language(s) - English
Resource type - Journals
eISSN - 1520-8567
pISSN - 1071-1023
DOI - 10.1116/1.1535927
Subject(s) - impurity , annealing (glass) , analytical chemistry (journal) , materials science , epitaxy , stress (linguistics) , passivation , vacancy defect , oxide , layer (electronics) , chemistry , nanotechnology , crystallography , composite material , metallurgy , linguistics , philosophy , organic chemistry , chromatography
P. N. K. Deenapanray and H. H. Tan gratefully acknowledge the financial support of the Australian Research Council.
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