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Mechanical Design of a Precision Instrument for Measuring the Roundness Profiles of Micro Shafts
Author(s) -
Neil Loychik,
Mathieu Barraja,
Afzal Husain Khan,
R. Ryan Vallance,
Eric R. Marsh,
Dave Arneson
Publication year - 2006
Publication title -
citeseer x (the pennsylvania state university)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1115/msec2006-21101
Subject(s) - roundness (object) , metrology , measuring instrument , machining , dimensional metrology , optics , measure (data warehouse) , detector , mechanical engineering , microscale chemistry , computer science , engineering , acoustics , physics , mathematics , database , thermodynamics , mathematics education
This paper presents a new instrument for measuring round- ness profiles of axially symmetric micro shafts with diameters below 250 micrometers. The instrument will measure form error in cutting tools used for micro machining, small-hole metrology probes, and other high aspect ratio micro structures. This in- strument operates on the same physical principle as scanning tunneling microscopes, which measure surface topography using fluctuations in tunneling of electrons between probe and sample. The instrument will measure roundness profiles using a fixed- sensitive-direction arrangement of the detector, similar to macro scale metrology instruments. Challenges resulting from dimen- sional scaling necessitate an entirely new instrument compared to conventional instruments. We describe the need for this in- strument, its working principle, architecture, the design of the traction drive mechanism, and the design of the nano position- ing stages.

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