X-Ray Induced Chemical Reaction Revealed by In Situ X-Ray Diffraction and Scanning X-Ray Microscopy in 15 nm Resolution | Zendy

Mingyuan Ge | Zendy; Wenjun Liu | Zendy; David C. Bock | Zendy; Vincent De Andrade | Zendy; Hanfei Yan | Zendy; Xiaojing Huang | Zendy; Kenneth J. Takeuchi | Zendy; Amy C. Marschilok | Zendy; Esther S. Takeuchi | Zendy; Huolin L. Xin | Zendy; Yong S. Chu | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

X-Ray Induced Chemical Reaction Revealed by In Situ X-Ray Diffraction and Scanning X-Ray Microscopy in 15 nm Resolution

Author(s) -

Mingyuan Ge,

Wenjun Liu,

David C. Bock,

Vincent De Andrade,

Hanfei Yan,

Xiaojing Huang,

Kenneth J. Takeuchi,

Amy C. Marschilok,

Esther S. Takeuchi,

Huolin L. Xin,

Yong S. Chu

Publication year - 2022

Publication title -

journal of electrochemical energy conversion and storage

Language(s) - English

Resource type - Journals

eISSN - 2381-6910

pISSN - 2381-6872

DOI - 10.1115/1.4054952

Subject(s) - synchrotron , synchrotron radiation , materials science , x ray , characterization (materials science) , diffraction , brightness , scanning electron microscope , resolution (logic) , optics , ion beam , microscopy , beam (structure) , analytical chemistry (journal) , nanotechnology , chemistry , physics , composite material , chromatography , artificial intelligence , computer science

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research