Open AccessPhysics-Based Gaussian Process Method for Predicting Average Product Lifetime in Design Stage
Author(s) -
Xinpeng Wei,
Daoru Han,
Xiaoping Du
Publication year - 2021
Publication title -
journal of computing and information science in engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.538
H-Index - 50
eISSN - 1944-7078
pISSN - 1530-9827
DOI - 10.1115/1.4049509
Subject(s) - mean time between failures , reliability (semiconductor) , reliability engineering , metric (unit) , process (computing) , gaussian process , product (mathematics) , computer science , measure (data warehouse) , gaussian , statistics , engineering , failure rate , data mining , mathematics , power (physics) , operations management , physics , geometry , quantum mechanics , operating system
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