Open AccessCalibration Tools for Scanning Thermal Microscopy Probes Used in Temperature Measurement Mode
Author(s) -
T.P. Nguyen,
Laurent Thiéry,
Sébastien Euphrasie,
Étienne Lemaire,
Sukhan Lee,
D. Briand,
Lionel Aigouy,
Séverine Gomès,
Pascal Vairac
Publication year - 2019
Publication title -
journal of heat transfer
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.722
H-Index - 126
eISSN - 1528-8943
pISSN - 0022-1481
DOI - 10.1115/1.4043381
Subject(s) - scanning thermal microscopy , calibration , materials science , resistor , temperature measurement , thermocouple , scanning probe microscopy , detector , thermal , resistive touchscreen , optoelectronics , thermal contact , optics , nanotechnology , atomic force microscopy , electrical engineering , voltage , statistics , physics , mathematics , engineering , quantum mechanics , meteorology , composite material
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