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Controlled Phase Interactions Between Pulsed Electric Fields, Ultrasonic Motion, and Magnetic Fields in an Anodic Dissolution Cell
Author(s) -
Curtis Bradley,
Johnson Samuel
Publication year - 2017
Publication title -
journal of manufacturing science and engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.366
H-Index - 98
eISSN - 1528-8935
pISSN - 1087-1357
DOI - 10.1115/1.4038569
Subject(s) - waveform , ultrasonic sensor , materials science , surface roughness , testbed , acoustics , machining , voltage , microscale chemistry , electrochemical machining , transducer , electromagnet , mechanical engineering , electrical engineering , computer science , magnet , engineering , composite material , physics , electrode , metallurgy , computer network , mathematics education , mathematics , quantum mechanics , electrolyte
This paper presents the design of a novel testbed that effectively combines pulsed electric field waveforms, ultrasonic velocity, and magnetic field waveforms in an anodic dissolution electrochemical machining (ECM) cell. The testbed consists of a custom three-dimensional (3D)-printed flow cell that is integrated with (i) a bipolar-pulsed ECM circuit, (ii) an ultrasonic transducer, and (iii) a custom-built high-frequency electromagnet. The driving voltages of the ultrasonic transducer and electromagnet are calibrated to achieve a timed workpiece velocity and magnetic field, respectively, in the machining area. The ECM studies conducted using this testbed reveal that phase-controlled waveform interactions between the three assistances affect both the material removal rate (MRR) and surface roughness (Ra) performance metrics. The triad-assisted ECM case involving phase-specific combinations of all three high-frequency (15.625 kHz) assistance waveforms is found to be capable of achieving a 52% increase in MRR while also simultaneously yielding a 78% improvement in the Ra value over the baseline pulsed-ECM case. This result is encouraging because assisted ECM processes reported in the literature typically improve only one of these performance metrics at the expense of the other. In general, the findings reported in this paper are expected to enable the realization of multifield assisted ECM testbeds using phase-specific input waveforms that change on-the-fly to yield preferential combinations of MRR and surface finish.

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