Open AccessLong-Term Non-Operating Reliability of Electronic Products
Author(s) -
Judy Pecht,
Michael Pecht,
Anthony J. Rafanelli
Publication year - 1997
Publication title -
journal of electronic packaging
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.523
H-Index - 52
eISSN - 1528-9044
pISSN - 1043-7398
DOI - 10.1115/1.2792222
Subject(s) - reliability (semiconductor) , term (time) , reliability engineering , materials science , nuclear engineering , mechanical engineering , engineering , thermodynamics , physics , power (physics) , quantum mechanics
Non-operating reliability assessment electrical failure mechanisms corrosion failure mechanisms corrosion failure mechanisms radiation failure mechanisms mechanical failure mechanisms lon-term non-operating reliability of selected electonic products testing and maintenance a framework for non-operating relaibilty assessment.
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