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Computational metrology has recently begun to play a prominent role in the evolution of engineering systems and the improvement of production technologies. Indeed, this field has become essential due to the use of advanced inspection technologies in manufacturing industries. These technologies, primarily emerging scanning technologies such as coordinate measuring machines CMMs, laser scanners, and three-dimensional cameras, have led to industrial demands for digital geometric processing DGP of sampled data. In response, new methodologies have been developed to cope with the complex metrology problems of registration, data fusion, surface reconstruction, and handling tolerances of the sampled data. These computational metrology methods are used mainly for design, manufacturing, inspection, and quality control applications. This series of special issues focuses on methodologies, fundamental theories, and practical solutions for reverse engineering and computational metrology. The current issue presents the state of the art research in reverse engineering and surface reconstruction. It offers new computational methods that utilize advanced scanning techniques and integrate data fusion strategies. The next issue focuses on emerging measurement techniques, computational metrology, and software algorithms for data analysis from CMM inspection. The 13 papers in this issue cover a variety of topics, dictated by the interests of the engineering, scientific, and manufacturing industrial communities: • RE for design of manufactured parts. • Scanning planning. • Data fusion methods of scanned data. • Surface reconstruction methods B-Splines, meshes.

Special Issue on Reverse Engineering and Computational Metrology: Part 1—Surface Reconstruction Methods