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Outliers Effect in Measurement Data for T-peel Adhesion Test using Robust Parameter Design
Author(s) -
Rozzeta Dolah,
Zenichi Miyagi,
Bo Bergman
Publication year - 2014
Publication title -
jurnal teknologi
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.191
H-Index - 22
eISSN - 2180-3722
pISSN - 0127-9696
DOI - 10.11113/jt.v68.3001
Subject(s) - outlier , anomaly detection , robust statistics , computer science , false alarm , data mining , constant false alarm rate , statistical hypothesis testing , statistics , noise (video) , linear regression , test data , mathematics , pattern recognition (psychology) , algorithm , artificial intelligence , image (mathematics) , programming language
As many researches focused on application of robust design engineering in practical case study, very less concerned on the criticality to data measurement system in parameter design. This paper will emphasize on the importance to be critical to data obtained during experiment. The existence of outliers is often ignored and the impact overlooked, thus endanger the results by producing false alarm and giving completely wrong parameter setting. The optimum condition from the data that contains outliers is compared with the corrected data measurement. The finding presents the indication procedure on how to confirm whether the data is reliable or not for evaluation. The data is unreliable when two main indicators are detected. Firstly, the measurement data plot detects outlier through linear regression analysis as it does not belong on the linear line. Secondly, poor reproducibility presented by estimation and confirmation of signal-to-noise ratio. This failure affects the experimental design and lead to wrong optimum condition. T-peel adhesion test using orthogonal array L9 is done as a case study to elucidate the detection of outlier and outlier effect on optimum condition.

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