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Performance Evaluation of Wavelet-Based Algorithm for Printed Circuit Board (PCB) Inspection
Author(s) -
Zuwairie Ibrahim,
Syed Abdul Rahman Al-Attas,
Zulfakar Aspar,
Rokhamsani Ghazali
Publication year - 2012
Publication title -
jurnal teknologi
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.191
H-Index - 22
eISSN - 2180-3722
pISSN - 0127-9696
DOI - 10.11113/jt.v35.609
Subject(s) - wavelet transform , printed circuit board , wavelet , computer science , artificial intelligence , computer vision , operating system
Operasi perbezaan imej seringkali digunakan dalam pemeriksaan papan litar bercetak secara automatik dan tidak terkecuali juga dalam banyak aplikasi pemprosesan imej yang lain. Pelaksanaan sistem pemeriksaan ini sangat bergantung kepada kelajuan operasi ini, di mana ia adalah masalah umum berkaitan dengan pembezaan imej. Matlamat teknik kami adalah untuk memperoleh pemeriksaan secara waktu nyata dengan menggunakan ubahan wavelet. Kertas kerja ini membentangkan satu algoritma baru berasaskan wavelet untuk pembezaan imej, dimana pembezaan imej dilakukan ke atas keluaran ubahan wavelet. Keputusan pelaksanaan teknik ini ke atas imej–imej papan litar bercetak menunjukkan pembaikan yang ketara berbanding dengan pembezaan imej secara tradisional. Kata kunci: Pembezaan imej; ubahan wavelet; papan litar bercetak; masa pemeriksaan Image difference operation is frequently used in automated printed circuit board (PCB) inspection system as well as in many other image processing applications. The inspection system performance depends critically on the speed of this operation, which is a common problem related to the image difference. The goal of our technique is to achieve real time inspection using wavelet transform. This paper presents a new wavelet–based algorithm for image difference, which computes image difference to the output of the wavelet transform. The results of applying the technique to PCB images showed significant improvement on the traditional image differencing. Key words: Image difference; wavelet transform; printed circuit board; inspection time

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