Open AccessA comprehensive range of X‐ray ionized‐reflection models
Author(s) -
Ross R. R.,
Fabian A. C.
Publication year - 2005
Publication title -
monthly notices of the royal astronomical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.058
H-Index - 383
eISSN - 1365-2966
pISSN - 0035-8711
DOI - 10.1111/j.1365-2966.2005.08797.x
Subject(s) - physics , ionization , reflection (computer programming) , accretion (finance) , x ray , spectral line , astrophysics , galaxy , plasma , atomic physics , astronomy , optics , ion , nuclear physics , quantum mechanics , computer science , programming language
X‐ray ionized reflection occurs when a surface is irradiated with X‐rays so intense that its ionization state is determined by the ionization parameter ξ∝ F / n , where F is the incident flux and n the gas density. It occurs in accretion, on to compact objects including black holes in both active galaxies and stellar‐mass binaries, and possibly in gamma‐ray bursts. Computation of model reflection spectra is often time consuming. Here we present the results from a comprehensive grid of models computed with our code, which has now been extended to include what we consider to be all energetically important ionization states and transitions. This grid is being made available as an ionized‐reflection model, reflion , for xspec .