Open AccessDeep seismic reflection and refraction profiling along the Aquitaine shelf (Bay of Biscay)
Author(s) -
Pinet Bertrand,
Montadert Lucien
Publication year - 1987
Publication title -
geophysical journal of the royal astronomical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.302
H-Index - 168
eISSN - 1365-246X
pISSN - 0016-8009
DOI - 10.1111/j.1365-246x.1987.tb04423.x
Subject(s) - geology , seismology , bay , crust , continental shelf , structural basin , continental crust , sedimentary basin , vertical seismic profile , seismic refraction , paleontology , geomorphology , oceanography
Summary. The 300 km ECORS ‐ Bay of Biscay profile was carried out along the Aquitaine shelf and comprised a complete set of experiments including zero‐offset and 7.5 km constant offset vertical seismic reflection and six expanding spread profiles. Large offset recordings were fundamental for the definition of the layered lower crust and the Moho, while ESPs provided decisive complementary information for the geological interpretation. These data show a strong variation in crustal thickness from about 20 km beneath the rifted Parentis basin, a failed arm of the oceanic Bay of Biscay, up to 35 km to the north below the Armorican shelf, in the Hercynian domain, and to the south below the Cantabria shelf, in the vicinity of the Pyrenean deformation front. The results have important implications for the behaviour of the crust during the formation of rifted sedimentary basins and during continental collision.