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Power Dissipation During Testing: Should We Worry About it?
Author(s) -
Vishwani D. Agrawal,
Robert C. Aitken,
J. Braden,
Joan Figueras,
S. Kumar,
Hans-Joachim Wunderlich,
Yervant Zorian
Publication year - 1997
Language(s) - English
DOI - 10.1109/vts.1997.10012

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