Open AccessAn SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18-<inline-formula> <tex-math notation="LaTeX">$\mu$ </tex-math> </inline-formula>m CMOS Technology
Author(s) -
Jeffrey Prinzie,
Sam Thys,
Bjorn Van Bockel,
Jialei Wang,
Valentijn De Smedt,
Paul Leroux
Publication year - 2018
Publication title -
ieee transactions on nuclear science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.537
H-Index - 122
eISSN - 1558-1578
pISSN - 0018-9499
DOI - 10.1109/tns.2018.2885693
Subject(s) - static random access memory , upset , cmos , voltage , electrical engineering , physics , radiation , electronic engineering , engineering , nuclear physics , mechanical engineering
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