Open AccessAn F-Band $n$ -Probe Standing Wave Detector for Complex Reflection Coefficient Measurements in 40-nm CMOS
Author(s) -
Bart Philippe,
Patrick Reynaert
Publication year - 2019
Publication title -
ieee transactions on microwave theory and techniques
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.372
H-Index - 190
eISSN - 1557-9670
pISSN - 0018-9480
DOI - 10.1109/tmtt.2019.2932981
Subject(s) - reflection coefficient , detector , cmos , reflection (computer programming) , optics , standing wave , physics , optoelectronics , materials science , electrical engineering , engineering , computer science , programming language
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