A systematic approach for the reliability of RFID systems
Author(s) -
S. Inoue,
D. Hagiwara,
H. Yasuura
Publication year - 2005
Publication title -
2004 ieee region 10 conference tencon 2004.
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1109/tencon.2004.1414562
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , power, energy and industry applications , robotics and control systems
In this paper, we address reliability issues in the 'digitally named world', which is the environment in which RFID (radio frequency identification) tags are attached to any objects in the real world. We propose a systematic approach to maintain the reliability and analyze the effect of our approach, and show that the possibility of identification failure are reduced to O(p/sup 2/) (0
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom