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Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs
Author(s) -
shyuekung lu,
shihchang huang
Publication year - 2004
Publication title -
records of the 2004 international workshop on memory technology, design and testing, 2004.
Language(s) - English
Resource type - Book series
ISBN - 0-7695-2193-2
DOI - 10.1109/mtdt.2004.7
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