Open AccessRedundancy & It's Not Just for Defects Anymore
Author(s) -
Robert C. Aitken
Publication year - 2004
Publication title -
records of the 2004 international workshop on memory technology, design and testing, 2004.
Language(s) - English
Resource type - Book series
ISBN - 0-7695-2193-2
DOI - 10.1109/mtdt.2004.19
This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.
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