Reliable Mobility Evaluation of Organic Field-Effect Transistors With Different Contact Metals
Author(s) -
Fanming Huang,
Ao Liu,
Huihui Zhu,
Yong Xu,
F. Balestra,
G. Ghibaudo,
YongYoung Noh,
Junhao Chu,
Wenwu Li
Publication year - 2019
Publication title -
ieee electron device letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.337
H-Index - 154
eISSN - 1558-0563
pISSN - 0741-3106
DOI - 10.1109/led.2019.2901315
Subject(s) - organic field effect transistor , materials science , electron mobility , transistor , field effect transistor , optoelectronics , electrical engineering , voltage , engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom