GLAMOROUS ANALOG TESTABILITY - WE ALREADY TEST THEM AND SHIP THEM - SO WHAT IS THE PROBLEM?
Author(s) -
Mohamed Hafed
Publication year - 2004
Publication title -
2004 international conferce on test
Language(s) - English
Resource type - Book series
ISBN - 0-7803-8581-0
DOI - 10.1109/itc.2004.83
Despite historically being one of the first areas to benefit from automation, analog circuit test poses particular challenges to modern test technology. In fact, contemporary analog test seems to represent a niche area for which solutions are always future ones. Yet, analog circuits are being mass-produced at astounding rates (whether within more complex digital IC's or as purely analog parts). This apparent paradox is addressed in this panel, which adopts a problem-solving approach to defining and addressing the analog test domain.
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