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Despite historically being one of the first areas to benefit from automation, analog circuit test poses particular challenges to modern test technology. In fact, contemporary analog test seems to represent a niche area for which solutions are always future ones. Yet, analog circuits are being mass-produced at astounding rates (whether within more complex digital IC's or as purely analog parts). This apparent paradox is addressed in this panel, which adopts a problem-solving approach to defining and addressing the analog test domain.

GLAMOROUS ANALOG TESTABILITY - WE ALREADY TEST THEM AND SHIP THEM - SO WHAT IS THE PROBLEM?