FORMAL DESCRIPTION OF TEST SPECIFICATION AND ATE ARCHITECTURE FOR MIXED-SIGNAL TEST

This paper proposes an approach to the formal description of test specifications and automatic test equipment (ATE) architectures for mixed-signal test. For this purpose, two sets of standard components are defined. A test specification and an ATE can then be described using these components and their properties. In the end, they can be represented by several mathematical matrices. Such a description, because of its clarity, is suitable for analysis using mathematical methods and, therefore, forms a basis for the automatic generation of an optimal test concept, which is now a particularly weak spot for the test program and device interface board development