100 DPPM in Nanometer Technology... Is it achievable?
Author(s) -
Greg Aldrich
Publication year - 2004
Publication title -
2004 international conferce on test
Language(s) - English
Resource type - Book series
ISBN - 0-7803-8581-0
DOI - 10.1109/itc.2004.2
As process technologies move to 100nm and below, maintaining acceptable defect levels has become more difficult. This panel assembles a group of experts in the area of manufacturing and test for an open discussion on the challenges and solutions available for achieving 100 defective parts per million (DPPM) or better with nanometer design technologies.
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