Trends in Testing Integrated Circuits
Author(s) -
Bart Vermeulen,
Camelia Hora,
Bram Kruseman,
Erik Jan Marinissen,
Robert Van Rijsinge
Publication year - 2004
Publication title -
2004 international conferce on test
Language(s) - English
Resource type - Book series
ISBN - 0-7803-8581-0
DOI - 10.1109/itc.2004.196
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.
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