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Testing in a high volume DSM Environment
Author(s) -
Thomas M. Storey
Publication year - 2004
Publication title -
2004 international conferce on test
Language(s) - English
Resource type - Book series
ISBN - 0-7803-8581-0
DOI - 10.1109/itc.2004.184
Today's test strategy options have become plentiful and diverse. Increasingly the correct approach is the one that reflects most accurately the business environment under which the product has been manufactured and tested. It is important, therefore, to first understand what factors are and will be dominating semiconductor manufacturing in the 90nm and lower technologies ahead.

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