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Today's large SOC designs are using higher percentages of outsourced IP and manufacturing than in the past. At the same time, native IC yield is shrinking due to higher memory defect densities and higher percentages of memory. Today, memory repair and redundancy, along with ECC methods are the prevalent means for active yield remediation. Methods need to emerge for standard logic. From a business perspective, there is a paradigm shift to outsourcing IP and manufacturing. This raises several important questions. How can yield be maximized? What are the limitations of active yield improvement? What is the fastest path to a solution if there is a yield issue? Who owns the native yield? Who owns the test yield?

Investment vs. Yield Relationship for Memories and IP in SOC